Muthanna Journal of Pure Sciences – MJPS
Vol.3 – No. 2 / October 2016
Hassan N. Al-Obaidi1 and Ali Ch. Hussian
1Deparment of Physics, College of Education, Al-Mustansiriyah University, Baghdad, Iraq.
2Deparment of Physics, College of Education, Al-Mustansiriyah University, GGTBBaghdad,
In the present work, it has been carried out theoretical investigation for electron mirror effect which occurs inside the electron scanning microscope SEM chamber. It is assumed that the trapped charge distribution on a sample surface as well as electron irradiation beam is point. Therefore, depending on this model results that obtained which show that parameters beam, like beam current has important influence to control in mirror image also scanning potential, as well as that the present treatment gives method to calculate trapped charge. Thus, the result clarifies good agreement with experimental one. As well polarization influence is investigated on the electron behavior then in determination of total trapped charge. Results have shown that the polarization charge appears clear influence to calculate the total trapped charge where the last decreases after adding the polarization charge by factor the dielectric constant.
Keywords: SEM, Mirror effect, Charging process, Insulators samples, Electron beams